• Bech top SEM, light and commpound Microscopy, Particle Analysis and Sample Preparation Tools
• Atomic Force Microscopy, Stylus and Optical Profilometry, NanoIR Spectroscopy.
• Thin Films by MBE, PVD, Thermal deposition, RF / AC / DC sputtering Characterized by using ESCA, Auger, SEM / FESEM etc
• Powders Characterization Techniques: Density, Pore Size, Surface Area, Chemisorption Water Vapor Sorption.
•(Gas Liquid Porometery, Liquid Liquid Porometery, Permporometery), Membrane and filtration testing , Membrane synthesis (film casting MEMCASTplus with temperature and without temperature option).
• Micro / Nano Indentation, Tribology, Modulus Mapping, DMA, In-Situ SEM and TEM Nano Mechanical Test Equipment, EDS, WDS, EBSD.
• Property Measurement Systems, VSM, SQUID, Spectroscopic Ellipsometers for Non-Destructive Thin Film and Bulk Material Characterization
• PECVD, PLD, ALD, MBE, MOCVD, RIE, DRIE, Sputtering, Probe Stations for Wafers, Circuit Boards, MEMS, Biological Structures etc