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XPS Systems

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XPS Systems

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Nexsa XPS System-New
  • Insulator Analysis, High Performance Spectroscopy and Avantage Software for for instrument control, data processing
  • Depth Profiling and Multi-technique Integration
  • Dual-mode ion source for expanded depth profiling capabilities and Small spot analysis
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K-Alpha Compact XPS
  • Al Kα X-ray monochromator for high chemical state resolution
  • Advanced viewing optics for precise feature and defect alignment
  • 128 Channel detection system for rapid parallel snapshot-acquisition and K-Alpha X-ray XPS System ideal for a multi-user environment
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ESCALAB Xi+ XPS Microprobe
  • An output lens to reform the parallel image. The image-forming lenses in the ESCALAB Xi+ were designed to optimize the quality of the parallel images.
  • A continuous, two-dimensional, position-sensitive detector to read the output from the channel plates without applying a detector signature
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Theta Probe ARXPS
  • Electron Analyzer, Microfocused Monochromated X-ray Source
  • Combined Low-energy Electron/Ion Flood Gun
  • Monatomic and Gas Cluster Ion Source (MAGCIS)
  • Lens, Analyzer, and Detector
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Avantage Data System
  • Full system control, calibration and traceability
  • Elemental and Chemical State Imaging Peak Deconvolution
  • Angle-Resolved XPS

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MAGCIS Dual Beam Ion Source
  • Investigating the oil-resistant coatings on touch screens
  • Enabling XPS Analysis of New Materials
  • Multi-Mode Depth Profiling with MAGCIS
  • New gas cluster ion sources overcome these limitations