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XPS Systems
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XPS Systems
XPS
XPS Systems
Nexsa XPS System-New
Insulator Analysis, High Performance Spectroscopy and Avantage Software for for instrument control, data processing
Depth Profiling and Multi-technique Integration
Dual-mode ion source for expanded depth profiling capabilities and Small spot analysis
K-Alpha Compact XPS
Al Kα X-ray monochromator for high chemical state resolution
Advanced viewing optics for precise feature and defect alignment
128 Channel detection system for rapid parallel snapshot-acquisition and K-Alpha X-ray XPS System ideal for a multi-user environment
ESCALAB Xi+ XPS Microprobe
An output lens to reform the parallel image. The image-forming lenses in the ESCALAB Xi+ were designed to optimize the quality of the parallel images.
A continuous, two-dimensional, position-sensitive detector to read the output from the channel plates without applying a detector signature
Theta Probe ARXPS
Electron Analyzer, Microfocused Monochromated X-ray Source
Combined Low-energy Electron/Ion Flood Gun
Monatomic and Gas Cluster Ion Source (MAGCIS)
Lens, Analyzer, and Detector
Avantage Data System
Full system control, calibration and traceability
Elemental and Chemical State Imaging
Peak Deconvolution
Angle-Resolved XPS
MAGCIS Dual Beam Ion Source
Investigating the oil-resistant coatings on touch screens
Enabling XPS Analysis of New Materials
Multi-Mode Depth Profiling with MAGCIS
New gas cluster ion sources overcome these limitations
